Development of Product Picking-Quality Inspection System through Convolution Filter and Ensemble-based Deep Learning Analysis for Distance Deviation Measurement and 2D Image
{"title":"Development of Product Picking-Quality Inspection System through Convolution Filter and Ensemble-based Deep Learning Analysis for Distance Deviation Measurement and 2D Image","authors":"Nabeto Yu, Ye-Bon Lee, Sujeong Baek","doi":"10.3795/ksme-a.2023.47.3.283","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":23293,"journal":{"name":"Transactions of The Korean Society of Mechanical Engineers A","volume":"130 1","pages":""},"PeriodicalIF":0.2000,"publicationDate":"2023-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Transactions of The Korean Society of Mechanical Engineers A","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3795/ksme-a.2023.47.3.283","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, MECHANICAL","Score":null,"Total":0}