P. Bele, U. Stimming, H. Yano, H. Uchida, Masahiro Watanabe
{"title":"STEM Image Analysis Using LAT Image Processing","authors":"P. Bele, U. Stimming, H. Yano, H. Uchida, Masahiro Watanabe","doi":"10.1002/IMIC.200990059","DOIUrl":null,"url":null,"abstract":"In order to develop catalysts it is important to characterize the system in terms of particle size and size distribution. TEM or STEM are used as the state-of-the-art methods. In this study monodispersed Pt3Co alloy nanoparticles supported on carbon black (CB) prepared by the nanocapsule method are investigated and the results are compared with a commercially available Pt3Co/C catalyst system. To avoid the obstacles of conventional bright-field TEM or STEM regarding the image analysis, an advanced computerized image processing procedure is introduced. The so-called local adaptive threshold (LAT) is a method for a precise determination of particle diameter and size distribution in the subnanometer scale. The results demonstrate the advantage of a completely computerized particle evaluation as compared to a conventional particle analysis.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"2 1","pages":"34-38"},"PeriodicalIF":0.0000,"publicationDate":"2009-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging & Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/IMIC.200990059","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In order to develop catalysts it is important to characterize the system in terms of particle size and size distribution. TEM or STEM are used as the state-of-the-art methods. In this study monodispersed Pt3Co alloy nanoparticles supported on carbon black (CB) prepared by the nanocapsule method are investigated and the results are compared with a commercially available Pt3Co/C catalyst system. To avoid the obstacles of conventional bright-field TEM or STEM regarding the image analysis, an advanced computerized image processing procedure is introduced. The so-called local adaptive threshold (LAT) is a method for a precise determination of particle diameter and size distribution in the subnanometer scale. The results demonstrate the advantage of a completely computerized particle evaluation as compared to a conventional particle analysis.