Texture of submicron Ni-Mn-Ga films studied by X-ray diffraction at the ANKA synchrotron source

Q2 Chemistry

Zeitschrift Fur Kristallographie Pub Date : 2007-11-01 DOI:10.1524/ZKSU.2007.2007.SUPPL_26.229

V. Chernenko, S. Doyle, M. Kohl, P. Müllner, S. Besseghini, M. Ohtsuka

引用次数: 10

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在ANKA同步加速器源上用x射线衍射研究了亚微米Ni-Mn-Ga薄膜的结构

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Zeitschrift Fur Kristallographie 物理-晶体学

CiteScore

1.47

自引率

0.00%

发文量

审稿时长

3 months

期刊介绍： Zeitschrift für Kristallographie International journal for structural, physical, and chemical aspects of crystalline materials ISSN 0044-2968 Founded in 1877 by Paul Groth Zeitschrift für Kristallographie is one of the world’s oldest scientific journals. In original papers, letters and review articles it presents results of theoretical or experimental study on crystallography.