{"title":"Characterization of the interface and intermediate layers of TiN/Ti/substrates systems","authors":"E.O. Ristolainen, K.A. Pischow","doi":"10.1016/0739-6260(92)90143-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100925,"journal":{"name":"Micron and Microscopica Acta","volume":"23 1","pages":"Pages 211-212"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0739-6260(92)90143-2","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron and Microscopica Acta","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0739626092901432","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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