Development of speckle interferometry algorithm and system

Abstract

Electronic speckle pattern interferometry (ESPI) method is a wholefield, non destructive measurement method widely used in the industries such as detection of defects on metal bodies such as cars or aeroplanes, detection of defects in intergrated circuits in digital electronics components and in the preservation of priceless artwork. In this research field, this method is widely used to develop algorithms for combining multispectral laser sources and to develop a new laboratory setup for implementing the multispectral speckle interferometry.