Clusters and boundaries in chalcogenide amorphous films

V. Lykah, N. Dyakonenko, A. V. Sinelnik, V. Bilozertseva, I. A. Korzh
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Abstract

The results of experimental and theoretical investigation of thin chalcogenide films are presented. Transmission electron microscopy demonstrated amorphous cluster structure at nanostructure level. The order parameters (bond angle and interatomic distance) are introduced. Cluster boundaries in terms of the order parameters have been obtained and analyzed.
硫系非晶薄膜中的团簇和边界
本文介绍了硫族化合物薄膜的实验和理论研究结果。透射电镜显示纳米级的非晶团簇结构。引入了键角和原子间距离等序参量。得到并分析了基于序参量的聚类边界。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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