C. Edwards, C. Morgan, John D. Rudolph, Danniel Slinker, Debashis Panda
{"title":"NextGen Calibration Utility for Tool Setup and Matching in Real-Time Automated Visual Inspection Systems","authors":"C. Edwards, C. Morgan, John D. Rudolph, Danniel Slinker, Debashis Panda","doi":"10.1109/ASMC49169.2020.9185401","DOIUrl":null,"url":null,"abstract":"Metrology and inspection algorithms, no matter how robust, will only exhibit acceptable performance over a finite range of image variation. As our algorithms become more and more advanced, geared towards finding smaller and smaller defects with ever-increasing accuracy, tool matching/calibration has become essential for successful inspection across a large fleet of tools. We present a new calibration utility that is versatile enough to be used for a wide variety of inspection systems. It allows us to ensure that the key imaging parameters on each tool are within a defined range which guarantees that the images produced by various tools are sufficiently similar and that the algorithm will perform as qualified. This also simplifies recipe management/portability across the fleet, allowing recipes created on one calibrated tool to be used on any other calibrated tool. This work covers a variety of multidisciplinary material including the calibration tray concept/design, key imaging parameters, user interface layout/design, as well as a variety of computer vision algorithms used to extract and examine the different regions of the calibration tray.","PeriodicalId":6771,"journal":{"name":"2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","volume":"45 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC49169.2020.9185401","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Metrology and inspection algorithms, no matter how robust, will only exhibit acceptable performance over a finite range of image variation. As our algorithms become more and more advanced, geared towards finding smaller and smaller defects with ever-increasing accuracy, tool matching/calibration has become essential for successful inspection across a large fleet of tools. We present a new calibration utility that is versatile enough to be used for a wide variety of inspection systems. It allows us to ensure that the key imaging parameters on each tool are within a defined range which guarantees that the images produced by various tools are sufficiently similar and that the algorithm will perform as qualified. This also simplifies recipe management/portability across the fleet, allowing recipes created on one calibrated tool to be used on any other calibrated tool. This work covers a variety of multidisciplinary material including the calibration tray concept/design, key imaging parameters, user interface layout/design, as well as a variety of computer vision algorithms used to extract and examine the different regions of the calibration tray.