Fast prediction for conducted EMI in flyback converters

Jianwei Liu, Yi Wang, Dan Jiang, Q. Cao
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引用次数: 8

Abstract

The flyback switched mode power supply often fails in electromagnetic compatibility (EMC) because of the easily aroused conducted electromagnetic interference (EMI). However, the measurement of conducted EMI during initial compliance tests requires strict test environments and expensive facilities, this makes the prediction of EMI important. This paper presents a time domain simulation method to predict the conducted EMI of a flyback converter before prototyping. The CST PCB Studio is utilized to extract parasitic parameters of a printed circuit board (PCB) based on 2D field solver and perform total circuit simulation. Experimental results validate that the presented modeling method is efficient and fast to predict EMI.
反激变换器传导电磁干扰的快速预测
反激式开关电源由于易产生传导电磁干扰,在电磁兼容(EMC)方面存在缺陷。然而,在初始符合性测试期间进行的电磁干扰测量需要严格的测试环境和昂贵的设备,这使得电磁干扰的预测很重要。提出了一种时域仿真方法,用于在样机制作前预测反激变换器的传导电磁干扰。利用CST PCB Studio基于二维场求解器提取印刷电路板(PCB)的寄生参数并进行全电路仿真。实验结果验证了该建模方法对电磁干扰预测的有效性和快速性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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