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Failure of a MEMS switch after environmental test

IEEE International Conference on Nano/Micro Engineered and Molecular Systems. IEEE International Conference on Nano/Micro Engineered and Molecular Systems Pub Date : 2015-01-01 DOI:10.1109/NEMS.2015.7147457
Xuran Ding, Yue Feng, W. Lou, Yunlong Guo
{"title":"Failure of a MEMS switch after environmental test","authors":"Xuran Ding, Yue Feng, W. Lou, Yunlong Guo","doi":"10.1109/NEMS.2015.7147457","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":73285,"journal":{"name":"IEEE International Conference on Nano/Micro Engineered and Molecular Systems. IEEE International Conference on Nano/Micro Engineered and Molecular Systems","volume":"37 1","pages":"417-420"},"PeriodicalIF":0.0000,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Conference on Nano/Micro Engineered and Molecular Systems. IEEE International Conference on Nano/Micro Engineered and Molecular Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEMS.2015.7147457","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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环境测试后MEMS开关失效
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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IEEE International Conference on Nano/Micro Engineered and Molecular Systems. IEEE International Conference on Nano/Micro Engineered and Molecular Systems
IEEE International Conference on Nano/Micro Engineered and Molecular Systems. IEEE International Conference on Nano/Micro Engineered and Molecular Systems
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