{"title":"All-electronic THz Nanoscopy","authors":"C. Liewald, F. Keilmann","doi":"10.1109/IRMMW-THZ.2018.8509941","DOIUrl":null,"url":null,"abstract":"We demonstrate 50-nm resolved near-field imaging at λ=500 μm for the first time, using a high-harmonic microwave circuit for emitting/detecting via free space to a standard s-SNOM, and map conductivity contrasts at near single-charge sensitivity.","PeriodicalId":6498,"journal":{"name":"2018 Conference on Lasers and Electro-Optics (CLEO)","volume":"86 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Conference on Lasers and Electro-Optics (CLEO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2018.8509941","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We demonstrate 50-nm resolved near-field imaging at λ=500 μm for the first time, using a high-harmonic microwave circuit for emitting/detecting via free space to a standard s-SNOM, and map conductivity contrasts at near single-charge sensitivity.