Performance Evaluation of Germanium-Tin Nanowire PFETs: Impact of Mole Fraction, Orientation and Doping

Dibakar Yadav, D. Nair
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Abstract

Materials with a light effective mass and high mobility are known to provide better performance for long channel transistors. However, with transistor dimensions scaling to sub-10 nm lengths, source to drain tunneling (SDT) becomes a major performance limiting factor for high mobility materials. In this paper, we examine the effect of SDT on the performance of germanium-tin (GeSn) short channel Nanowire (NW) p-MOSEFTs using rigorous ballistic quantum transport simulations. We simulate GeSn NWs in different transport orientations and with Sn mole fraction values of 0.05 and 0.11 to identify the channel direction with optimum effective mass to limit SDT. We also examine the role of reduced source/drain doping in enhancing the on-state performance of GeSn NWs by limiting SDT current in off-state.
锗锡纳米线pfet的性能评价:摩尔分数、取向和掺杂的影响
已知具有轻有效质量和高迁移率的材料可以为长通道晶体管提供更好的性能。然而,随着晶体管尺寸缩小到10纳米以下的长度,源漏隧道(SDT)成为高迁移率材料的主要性能限制因素。在本文中,我们使用严格的弹道量子输运模拟研究了SDT对锗锡(GeSn)短通道纳米线(NW) p-MOSEFTs性能的影响。我们模拟了不同输运方向、Sn摩尔分数分别为0.05和0.11的GeSn NWs,以确定限制SDT的最佳有效质量通道方向。我们还研究了减少源极/漏极掺杂通过限制非稳态SDT电流来提高GeSn NWs的导通性能的作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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