José Augusto Cadena Moreano, Nora Bertha La Serna Palomino, Alex Christian Llano Casa
{"title":"Facial recognition techniques using SVM: A comparative analysis","authors":"José Augusto Cadena Moreano, Nora Bertha La Serna Palomino, Alex Christian Llano Casa","doi":"10.29019/enfoque.v10n3.493","DOIUrl":null,"url":null,"abstract":"This paper presents a literary review of facial recognition in 2D, which plays an important role in the life of the human being in terms of safety, work activity, etc. The focus is on the results obtained by some researchers with the application of feature extraction techniques, pattern classifiers, databases and their respective percentage of efficiency obtained. The objective is to determine efficient techniques that allow an optimal 2D facial recognition process, based on the quality of databases, feature extractors and pattern classifiers.","PeriodicalId":72918,"journal":{"name":"Enfoque UTE : revista cientifica","volume":"86 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Enfoque UTE : revista cientifica","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.29019/enfoque.v10n3.493","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This paper presents a literary review of facial recognition in 2D, which plays an important role in the life of the human being in terms of safety, work activity, etc. The focus is on the results obtained by some researchers with the application of feature extraction techniques, pattern classifiers, databases and their respective percentage of efficiency obtained. The objective is to determine efficient techniques that allow an optimal 2D facial recognition process, based on the quality of databases, feature extractors and pattern classifiers.