{"title":"A 56Gb/s PAM-4 Receiver with Voltage Pre-Shift CTLE and 10-Tap DFE of Tap-1 Speculation in 7nm FinFET","authors":"Wei-Chih Chen, Shu-Chun Yang, Yu-Nan Shih, Wen-Hung Huang, Chien-Chun Tsai, K. Hsieh","doi":"10.23919/VLSIC.2019.8777992","DOIUrl":null,"url":null,"abstract":"A 56Gb/s PAM-4 wireline receiver testchip is demonstrated in 7nm FinFET. The equalization is achieved with four stages continuous time linear equalizer (CTLE) and half-rate 10-tap decision feedback equalizer (DFE) with first tap speculative. Proposed voltage pre-shift scheme uses a programmable offset added on top of the differential data signal to alleviate front end nonlinearity. The receiver achieves BER $\\lt 1 \\mathrm { E } - 8$ at optimal timing pre-FEC and 0.2UI at 1E-6 BER over 25dB insertion loss at 14GHz. The test-chip consumes 450mW under 1.0V/1.2V power supplies, giving a FoM of 0.321pJ/bit/dB. The active area is 0.352mm2.","PeriodicalId":6707,"journal":{"name":"2019 Symposium on VLSI Circuits","volume":"9 1","pages":"C272-C273"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSIC.2019.8777992","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A 56Gb/s PAM-4 wireline receiver testchip is demonstrated in 7nm FinFET. The equalization is achieved with four stages continuous time linear equalizer (CTLE) and half-rate 10-tap decision feedback equalizer (DFE) with first tap speculative. Proposed voltage pre-shift scheme uses a programmable offset added on top of the differential data signal to alleviate front end nonlinearity. The receiver achieves BER $\lt 1 \mathrm { E } - 8$ at optimal timing pre-FEC and 0.2UI at 1E-6 BER over 25dB insertion loss at 14GHz. The test-chip consumes 450mW under 1.0V/1.2V power supplies, giving a FoM of 0.321pJ/bit/dB. The active area is 0.352mm2.