Crystallized amorphous silicon for low-cost solar cells

J. Yi, R. Wallace, N. Sridhar, Z. Wang, K. Xie, D.D.L. Chung, C.R. Wie, K. Etemadi, W.A. Anderson, M. Périard, R.W. Cochrane, Y. Diawara, J.F. Currie, J. Coleman
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引用次数: 3

Abstract

Hydrogenated amorphous silicon (a-Si:H), 1–10 μm thick, was deposited onto stainless steel and molybdenum sheets using catholic d.c. glow discharge in a gradient field and by plasma-enhanced chemical vapor deposition. The films were subsequently crystallized by isothermal heating in N2, rapid thermal processing, isothermal annealing in vacuum (IAV) or isothermal annealing after vycor encapsulation (IAE). All techniques led to crystallization as revealed by X-ray diffraction. Annealing by IAV at 1000 °C for 7 h or IAE at 700 °C for 8 h gave the most intense (111) silicon diffraction peaks. Auger electron spectroscopy showed significant diffusion of iron into the silicon for stainless steel substrates. Energy recoil detection of as-deposited a-Si:H showed good uniformity of both silicon and hydrogen.

用于低成本太阳能电池的结晶非晶硅
采用梯度场阴极直流辉光放电和等离子体增强化学气相沉积技术,在不锈钢和钼片上制备了厚度为1 ~ 10 μm的氢化非晶硅(a- si:H)。然后通过氮气等温加热、快速热处理、真空等温退火(IAV)或vycor包封后等温退火(IAE)对薄膜进行结晶。所有的技术都导致了x射线衍射所揭示的结晶。1000℃下IAV退火7 h或700℃下IAE退火8 h得到了最强烈的(111)硅衍射峰。俄歇电子能谱显示铁在不锈钢衬底硅中的明显扩散。沉积的a-Si:H的能量反冲检测结果表明,硅和氢的均匀性都很好。
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