Production of Thin PbxSn1–xTe Films by “Hot Wall” Method for Creating IR-Photodetectors

IF 0.3 Q4 ENGINEERING, MULTIDISCIPLINARY
V. A. Ivanov, V. V. Krasovskii, V. Gremenok, L. Postnova
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引用次数: 0

Abstract

Alloys of lead and tin telluride (PbxSn1–xTe) are materials with good thermoelectric properties, as well as semiconductors that can be used as long-wave infrared detectors. Polycrystalline telluride of PbxSn1–xTe (0.05 £ x £ 0.80) alloys has been synthesized by direct fusion technique. Thin films of these materials have been obtained by the hot wall method depositing Сorning 7059 on glass substrates at Tsub = (200–350) oC and vacuum of about 10–5 Torr. The microstructure of the films has been investigated by XRD, SEM and EDX methods. The X-ray spectra of thin films have been in satisfactorily agreement with the spectra of the powder target and indicated the absence of binary phases. The films have shown a natural cubic crystalline structure. While increasing the lead content, the unit cell parameter of the crystal also increases. The established linear relationship between the unit cell parameter and the elemental composition corresponds to Vegard's law. The SEM analysis has shown that the films are polycrystalline, have a columnar structure, are tightly packed and have good mechanical adhesion. The grain size depends on the chemical composition and temperature of the substrate. The electrical measurements have shown that the grown films are non-degenerate semiconductors of p-type conductivity. The conductivity of the films was in the range of σ = (3 × 101)–(1 × 104) Ω–1×cm–1. An increase of lead concentration leads to a decrease in electrical conductivity. Hall mobility in the grown thin films increases in the range of changes in the lead content from ~10 to ~23 at. %, and decreases with a further increase to ~33 at. %. At the same time, the strongest dependence of the decrease in mobility on an increase in temperature increase is observed for films with a high lead content and is explained by the predominant scattering of charge carriers by vibrations of the crystal lattice. For a sample with an average lead concentration, an alternative effect of two scattering mechanisms is observed in the temperature dependence of the mobility: by impurity ions and by phonons.
用“热壁”法制备PbxSn1-xTe薄膜制备红外探测器
碲化铅锡合金(PbxSn1-xTe)是具有良好热电性能的材料,也是可以用作长波红外探测器的半导体材料。采用直接熔合法制备了PbxSn1-xTe (0.05 × 0.80)合金的多晶碲化物。在Tsub = (200-350) oC和真空约10-5 Torr的条件下,通过热壁法将Сorning 7059沉积在玻璃衬底上获得了这些材料的薄膜。采用XRD、SEM和EDX等方法对膜的微观结构进行了表征。薄膜的x射线谱图与粉末靶的x射线谱图符合得很好,表明没有二元相。薄膜呈现出天然的立方晶体结构。随着铅含量的增加,晶体的晶胞参数也随之增加。所建立的单晶参数与元素组成之间的线性关系符合维加德定律。SEM分析表明,薄膜为多晶,具有柱状结构,排列紧密,机械附着力好。晶粒大小取决于基体的化学成分和温度。电学测量表明,生长的薄膜是具有p型电导率的非简并半导体。薄膜的电导率在σ = (3 × 101) ~ (1 × 104) Ω-1×cm-1范围内。铅浓度的增加导致电导率的降低。在铅含量从~10 ~ ~23 at的变化范围内,生长薄膜的霍尔迁移率增加。%,并随着进一步增大而减小至~33 at。%。同时,对于高铅含量的薄膜,迁移率的降低对温度升高的依赖性最强,这可以用晶格振动导致载流子的主要散射来解释。对于具有平均铅浓度的样品,在迁移率的温度依赖性中观察到两种散射机制的替代效应:杂质离子和声子。
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来源期刊
Science & Technique
Science & Technique ENGINEERING, MULTIDISCIPLINARY-
自引率
50.00%
发文量
47
审稿时长
8 weeks
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