{"title":"Modeling and suppression of transmitter leakage in concurrent dual-band transceivers with carrier aggregation","authors":"Yu Chao, A. Zhu","doi":"10.1109/MWSYM.2015.7166941","DOIUrl":null,"url":null,"abstract":"In this paper, a dual-basis envelope-dependent sideband distortion model is proposed to characterize the distortion induced by transmitter leakage in concurrent dual-band transceivers. It is constructed by first generating a nonlinear basis function that maps the inputs to the target frequency band where the distortion is to be cancelled, and then weighting it with envelope-dependent nonlinearities. Experimental results demonstrated that excellent cancellation performance can be achieved with very low implementation complexity by employing the proposed model.","PeriodicalId":6493,"journal":{"name":"2015 IEEE MTT-S International Microwave Symposium","volume":"32 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE MTT-S International Microwave Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.2015.7166941","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
In this paper, a dual-basis envelope-dependent sideband distortion model is proposed to characterize the distortion induced by transmitter leakage in concurrent dual-band transceivers. It is constructed by first generating a nonlinear basis function that maps the inputs to the target frequency band where the distortion is to be cancelled, and then weighting it with envelope-dependent nonlinearities. Experimental results demonstrated that excellent cancellation performance can be achieved with very low implementation complexity by employing the proposed model.