Effect of Package Singulation Parameters on Dual Flat Non-leaded Package Delamination

Siying Wu, Shwu Miin Tan, J. Xue, Cheong Huat Ng, Zhigang Li
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Abstract

With the evolution of electronic and automotive field, the reliability requirement of package is getting stringent. The package is required to withstand the extreme conditions while maintaining good electrical performance. Interfacial delamination is one of the key factors that impacts the reliability of electronic package. When the delamination occurs between lead frame (LF) and epoxy molding compound (EMC), the moisture will ingress into the package and cause bond pad or wedge corrosion, which leads to electrical failure.To verify the robustness of Dual Flat Non-leaded (DFN) package, the effects of package singulation parameters on package delamination performance were investigated in this study, dicing blade types, saw method, spindle speed, feed speed, and cooling water flow rate. As the result shown, the blade with small grit size had better cutting quality and induced less stress than large grit size blade. Reducing the cutting stress was beneficial to improve the delamination performance. And the cutting methods also influenced on delamination performance. The chopper cut and normal cut method were used in the same type of package to compare the delamination performance. The results of C-SAM shown the normal cut had better delamination performance than chopper cut. In addition, the delamination performance deteriorated with increasing spindle speed, which was related to the adverse impact of blade at high spindle speed and heat generation of friction. And the feed rate also had a small effect on delamination. Besides, hundred-degree celsius temperature of heat will be generated during blade cutting, which will reduce the adhesion strength and cause the expand and contract of EMC and LF. Therefore, cooling the blade with high cooling water rate could help in delamination.In summary, the effect of package singulation on delamination defects was investigated in this paper. The delamination performance could be optimized by selecting suitable EMC, LF surface treatment & design, dicing blade, cutting method and singulation parameters.
封装仿真参数对双平面无铅封装分层的影响
随着电子和汽车领域的发展,对封装的可靠性要求越来越高。该包装要求能够承受极端条件,同时保持良好的电气性能。界面分层是影响电子封装可靠性的关键因素之一。当引线框架(LF)和环氧成型化合物(EMC)之间发生分层时,湿气将进入封装并导致键垫或楔腐蚀,从而导致电气故障。为了验证双平面无铅(DFN)封装的稳健性,本研究考察了封装仿真参数、切割刀片类型、锯切方式、主轴转速、进给速度和冷却水流量对封装分层性能的影响。结果表明,与大粒度叶片相比,小粒度叶片具有更好的切削质量和更小的应力。减小切削应力有利于提高分层性能。切削方式对分层性能也有影响。采用斩波切割法和普通切割法对同一类型封装进行分层性能比较。C-SAM结果表明,正常切割比斩波切割具有更好的分层性能。此外,分层性能随主轴转速的增加而恶化,这与主轴转速高时叶片的不利影响和摩擦产生热量有关。进料速率对分层的影响较小。此外,刀片切割过程中会产生摄氏百度的高温,会降低粘接强度,造成EMC和LF的膨胀和收缩。因此,采用高冷却水率冷却叶片有利于分层。综上所述,本文研究了封装模拟对分层缺陷的影响。选择合适的电磁兼容、LF表面处理与设计、切片刀片、切割方式和仿真参数可以优化其分层性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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