Implementation of ALD-grown MgO layers as electron-selective contact for silicon solar cells

Ganna Chistiakova, L. Korte
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引用次数: 0

Abstract

This work focuses on the investigation of Magnesium oxide (MgO) layers as passivating electron selective contact for silicon solar cells. It was observed that MgO layers produced by atomic layer deposition (ALD) do not provide good passivation by themselves on c-Si wafers. Therefore, an intermediate passivation layer was needed to maintain a high VOC in solar cells with MgO layers. In this work, i-aSi:H layers were considered as a passivating buffer layer. The low MgO deposition temperatures (< 200°C) ensured compatibility with i-aSi:H layers. We investigate the dependence of solar cell performance on MgO layer thickness and influence of the annealing on the device performance. Additionally, possible metallization schemes at the interface to the MgO layer are discussed.
ald生长的MgO层作为硅太阳能电池电子选择触点的实现
本文主要研究了氧化镁(MgO)层作为硅太阳能电池钝化电子选择接触的作用。结果表明,原子层沉积法(ALD)制备的MgO层本身在c-Si晶片上没有良好的钝化效果。因此,需要一种中间钝化层来维持具有MgO层的太阳能电池的高VOC。在这项工作中,i-aSi:H层被认为是钝化缓冲层。低MgO沉积温度(< 200°C)确保了与i-aSi:H层的相容性。我们研究了MgO层厚度对太阳能电池性能的影响以及退火对器件性能的影响。此外,还讨论了MgO层界面上可能的金属化方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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