{"title":"Thallium-Related Isoelctronic Bound Excitons in Silicon. A Bistable Defect at Low Temperatures","authors":"H. Conzelmann, A. Hangleiter, J. Weber","doi":"10.1515/9783112493182-027","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":10913,"journal":{"name":"Day 1 Wed, February 23, 2022","volume":"8 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"1986-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Day 1 Wed, February 23, 2022","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/9783112493182-027","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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