{"title":"Derivation of charge transfer parameters at semiconductor-liquid interfaces","authors":"S. Hinckley , D. Haneman","doi":"10.1016/0378-5963(85)90242-9","DOIUrl":null,"url":null,"abstract":"<div><p>The excess-carrier charge transfer velocity, <em>υ</em><sub>cp</sub>, is an important parameter describing the efficiency of charge transfer across a solid-liquid interface. By using recent theory to analyze current-voltage curves of photoelectrochemical cells, we have been able to derive values of <em>υ</em><sub>cp</sub> for CdSe films in aqueous polysulfide electrolytes and measure the effects of varying the sulfur concentration. The parameter, <em>υ</em><sub>cp</sub>, is found to vary at short circuit conditions, from 1.2 × 10<sup>6</sup> to 1.36 × 10<sup>6</sup> cm s<sup>−1</sup> on increasing the sulfur concentration from 0 to 3.0M. In addition it has been found that <em>υ</em><sub>vp</sub> has only a weak voltage dependence described by an equation linear in voltage.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 1075-1082"},"PeriodicalIF":0.0000,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90242-9","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applications of Surface Science","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0378596385902429","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The excess-carrier charge transfer velocity, υcp, is an important parameter describing the efficiency of charge transfer across a solid-liquid interface. By using recent theory to analyze current-voltage curves of photoelectrochemical cells, we have been able to derive values of υcp for CdSe films in aqueous polysulfide electrolytes and measure the effects of varying the sulfur concentration. The parameter, υcp, is found to vary at short circuit conditions, from 1.2 × 106 to 1.36 × 106 cm s−1 on increasing the sulfur concentration from 0 to 3.0M. In addition it has been found that υvp has only a weak voltage dependence described by an equation linear in voltage.
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