Analysis of Lattice Constants and Error for The Hexagonal Crystal Structure of Silicon Dioxide Using The Cramer-Cohen Method

Abstract

Has successfully analyzed the lattice constants and the error of the hexagonal crystal structure of silicon dioxide (SiO2) using the Cramer-Cohen method. The peak data for the silicon dioxide material used are secondary data from the ICDD. The Cramer-Cohen method calculations show that the lattice constants are relatively the same as the secondary data from the ICDD, with an average error analysis value of 0,001531805%. This shows that the analysis of the lattice constant and the error of the hexagonal crystal structure of silicon dioxide (SiO2) using the Cramer-Cohen method is very accurate.