Breaking arc characteristics in various power supply frequencies

N. Miki, K. Sawa
{"title":"Breaking arc characteristics in various power supply frequencies","authors":"N. Miki, K. Sawa","doi":"10.1109/HOLM.2007.4318231","DOIUrl":null,"url":null,"abstract":"The movement to the high frequency is strong in communication systems. But semiconductors used in such systems are known to have various problems in high frequency. Therefore an electromechanical switch of supreme RF (radio frequency) characteristics in the insertion loss and isolation is expected. However, in RF range, the arc characteristics generated between electric contacts have not been clarified. In this research, we examine basic characteristics of the breaking arc in high frequency especially the arc duration and the V-I characteristic. According to the results, it turned out that the arc duration becomes shorter and the arc voltage becomes lower as the frequency rises. Therefore, less damage is expected. Further, this experiment was conducted by interrupting the circuit current at its peak value, where arcing duration is shorter than T/4 which is the time of current zero. But after the arc extinction of current zero, reignition occurs over 600 kHz, then arc duration is longer than T/4. The reignition behavior is examined by measuring arc waveform in higher frequency.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2007.4318231","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The movement to the high frequency is strong in communication systems. But semiconductors used in such systems are known to have various problems in high frequency. Therefore an electromechanical switch of supreme RF (radio frequency) characteristics in the insertion loss and isolation is expected. However, in RF range, the arc characteristics generated between electric contacts have not been clarified. In this research, we examine basic characteristics of the breaking arc in high frequency especially the arc duration and the V-I characteristic. According to the results, it turned out that the arc duration becomes shorter and the arc voltage becomes lower as the frequency rises. Therefore, less damage is expected. Further, this experiment was conducted by interrupting the circuit current at its peak value, where arcing duration is shorter than T/4 which is the time of current zero. But after the arc extinction of current zero, reignition occurs over 600 kHz, then arc duration is longer than T/4. The reignition behavior is examined by measuring arc waveform in higher frequency.
不同电源频率下的断弧特性
在通信系统中,高频运动很强。但是,在这种系统中使用的半导体在高频方面存在各种问题。因此,期望在插入损耗和隔离方面具有最高RF(射频)特性的机电开关。然而,在射频范围内,电触点之间产生的电弧特性尚未明确。本文研究了高频断弧的基本特性,特别是弧长和V-I特性。结果表明,随着频率的升高,电弧持续时间变短,电弧电压变低。因此,预计损失会更小。此外,本实验是在电路电流的峰值处进行中断,此时电弧持续时间小于T/4,即电流为零的时间。但电流为零灭弧后,在600khz以上发生重燃,则弧长大于T/4。通过测量高频电弧波形来检测复燃行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信