{"title":"An automatic defect detection method for TO56 semiconductor laser using deep convolutional neural network","authors":"Hang Zhang, Rong Li, D. Zou, Jian Liu, Ning Chen","doi":"10.2139/ssrn.4267689","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":10663,"journal":{"name":"Comput. Ind. Eng.","volume":"44 1","pages":"109148"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Comput. Ind. Eng.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2139/ssrn.4267689","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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