Keisuke Abe, H. Ejiri, S. Matsuoka, A. Kumada, Kunihiko Hidaka, Taiki Donen, Mitsuru Tsukima
{"title":"真空ギャップにおける微小粒子による絶縁破壊現象;真空ギャップにおける微小粒子による絶縁破壊現象;Electrical Breakdown Triggered by Micro Particle in Vacuum Gap","authors":"Keisuke Abe, H. Ejiri, S. Matsuoka, A. Kumada, Kunihiko Hidaka, Taiki Donen, Mitsuru Tsukima","doi":"10.1541/IEEJFMS.137.95","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":23081,"journal":{"name":"The transactions of the Institute of Electrical Engineers of Japan.A","volume":"111 1","pages":"95-100"},"PeriodicalIF":0.0000,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The transactions of the Institute of Electrical Engineers of Japan.A","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1541/IEEJFMS.137.95","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}