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Acceleration with FPGA for blocks and subblocks edge pattern classification in DCT domain images

... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference Pub Date : 2014-05-12 DOI:10.1109/I2MTC.2014.6860834
Vega-Pineda Javier, Rivera-Mejia Jose, Sandoval-Rodriguez Rafael, Trujillo-Schiaffino Gerardo
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用FPGA加速DCT域图像的分块和子块边缘模式分类
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... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference
... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference
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