A. Andersen, Nataly Chen, Andrew Nuss, N. Low, Wousik Kim, R. Chave
{"title":"High-Resistivity Measurement System for Spacecraft Dielectrics","authors":"A. Andersen, Nataly Chen, Andrew Nuss, N. Low, Wousik Kim, R. Chave","doi":"10.1109/ICD46958.2020.9341974","DOIUrl":null,"url":null,"abstract":"Volume resistivity is a key material property needed for assessing the risk of electrostatic discharge (ESD) due to spacecraft charging. We have developed a volume resistivity test system capable of measuring volume resistivity ≥1019 Ω·cm in vacuum and at cryogenic temperatures. Key components of this new setup include a custom test fixture and very low noise battery voltage supply.","PeriodicalId":6795,"journal":{"name":"2020 IEEE 3rd International Conference on Dielectrics (ICD)","volume":"39 1","pages":"423-426"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 3rd International Conference on Dielectrics (ICD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICD46958.2020.9341974","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Volume resistivity is a key material property needed for assessing the risk of electrostatic discharge (ESD) due to spacecraft charging. We have developed a volume resistivity test system capable of measuring volume resistivity ≥1019 Ω·cm in vacuum and at cryogenic temperatures. Key components of this new setup include a custom test fixture and very low noise battery voltage supply.