A 12-bit 1.6 GS/s interleaved SAR ADC with dual reference shifting and interpolation achieving 17.8 fJ/conv-step in 65nm CMOS

J. Nam, Mohsen Hassanpourghadi, Aoyang Zhang, M. Chen
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引用次数: 12

Abstract

A 12-bit SAR ADC architecture with dual reference shifting and interpolation technique has been proposed and implemented with 8-way time interleaving in 65nm CMOS. The proposed technique converts 4 bits per SAR conversion cycle with reduced overhead, which is a key to achieve both high speed and resolution while maintaining low power consumption. The measured peak SNDR is 72dB and remains above 65.3dB at 1-GHz input frequency at sample rate of 1.6 GS/s. It achieves a record power efficiency of 17.8fJ/conv-step among the recently published high-speed/resolution ADCs.
一个12位1.6 GS/s的交错SAR ADC,具有双参考移位和插值,在65nm CMOS中实现17.8 fJ/ convstep
提出了一种采用双基准移位和插值技术的12位SAR ADC架构,并在65nm CMOS上实现了8路时间交错。该技术每个SAR转换周期转换4位,降低了开销,这是在保持低功耗的同时实现高速和分辨率的关键。在1 ghz输入频率下,采样率为1.6 GS/s时,测量到的峰值SNDR为72dB,保持在65.3dB以上。它在最近发布的高速/分辨率adc中实现了17.8fJ/ v-step的创纪录功率效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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