Protocol requirements in an SJTAG/IJTAG environment

G. Carlsson, J. Holmqvist, E. Larsson
{"title":"Protocol requirements in an SJTAG/IJTAG environment","authors":"G. Carlsson, J. Holmqvist, E. Larsson","doi":"10.1109/TEST.2007.4437658","DOIUrl":null,"url":null,"abstract":"Integrated circuits, printed circuits boards, and multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/ IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2007.4437658","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Integrated circuits, printed circuits boards, and multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/ IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT.
SJTAG/IJTAG环境中的协议需求
集成电路、印刷电路板和多板系统的测试变得越来越复杂。一个主要的障碍是测试访问,这将通过在测试设备(dut)和测试管理器之间的有效通信标准来缓解。目前,内部联合测试访问组(IJTAG)在微观层面上工作,制定嵌入式芯片上仪器的接口标准,而系统JTAG (SJTAG)在宏观层面上工作,制定系统级测试管理标准,将IJTAG兼容的仪器与系统测试管理器连接起来。本文讨论了在SJTAG/ IJTAG环境中使用的测试协议的需求。我们已经从许多使用场景中进行了分析并定义了协议需求。我们采用了围绕播放器(解释器)构建的标准测试和编程语言(STAPL),并定义了所需的扩展。这些扩展已经在STAPL的扩展版本中实现,我们已经用PC机作为测试控制器,FPGA作为被测设备进行了实验。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信