Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact

Abstract

In principle, a patterned dielectric back contact structure in a GaAs thermophotovoltaic device boosts the sub-bandgap reflectance. Rigorous coupled wave analysis method is used to study the three dimensional (3D) periodic grating effects of metal point contact diameter and spacing on sub-bandgap reflectance of the device.