Optimal Design of Reliability Acceptance Sampling Plan Based on Sequential Order Statistics

Abstract

Abstract The concept of sequential order statistics were introduced by Kamps in 1995. In this article, we derive an acceptance sampling plan, for units having exponentially distributed lifetime, using sequential order statistics. Based on data obtained from progressive type II censoring using constant stress accelerated life tests, we obtain the maximum likelihood estimates of the parameters of the exponential distribution. Further, a log linear life-stress relationship is assumed to derive the exact distributions of the estimators of the parameters of exponential distribution. The parameters of the sampling scheme are obtained by minimizing expected total testing cost satisfying usual probability requirements. Some numerical results are presented in a table to illustrate our plans.