Dielectric materials for use as output window in high-power klystrons

Abstract

The breakdown of RF windows used in high-power klystrons is one of the most serious problems in the development of klystrons. The durability of several dielectric materials used for RF windows is discussed in terms of secondary electron emission (SEE), cathodoluminescence, and dielectric loss. High-power tests of these materials with TiN coatings, thus having low SEE, were also carried out using a traveling wave resonant ring. The results show that alumina ceramics are superior to sapphire and aluminum nitride. The origin of breakdown is investigated, and the requirements for RF window materials are presented. >