The Origin of the Minority Impurity States in Heavily Doped Semiconductors

D. S. Domanevskii, V. V. Krasovskii, M. V. Prokopenya, V. A. Vilkotskii, S. V. Zhokhovets
{"title":"The Origin of the Minority Impurity States in Heavily Doped Semiconductors","authors":"D. S. Domanevskii, V. V. Krasovskii, M. V. Prokopenya, V. A. Vilkotskii, S. V. Zhokhovets","doi":"10.1002/PSSB.2221330231","DOIUrl":null,"url":null,"abstract":"The influence is examined of growth conditions of heavily doped n-type semiconductors on the width and energy position of Gaussian-shape impurity band where non-equilibrium holes are localized. The energy levels of the impurity band are shown to be caused by associations of oppositely charged crystal imperfections (so-called associates) including several shallow donor impurity atoms and a deep structural defect. The reason of Gaussian broadening of these states is a random spatial arrangement of associated imperfections about each other within a given associate. \n \n \n \n[Russian Text Ignored].","PeriodicalId":10913,"journal":{"name":"Day 1 Wed, February 23, 2022","volume":"168 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"1986-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Day 1 Wed, February 23, 2022","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/PSSB.2221330231","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The influence is examined of growth conditions of heavily doped n-type semiconductors on the width and energy position of Gaussian-shape impurity band where non-equilibrium holes are localized. The energy levels of the impurity band are shown to be caused by associations of oppositely charged crystal imperfections (so-called associates) including several shallow donor impurity atoms and a deep structural defect. The reason of Gaussian broadening of these states is a random spatial arrangement of associated imperfections about each other within a given associate. [Russian Text Ignored].
重掺杂半导体中少数杂质态的起源
研究了重掺杂n型半导体的生长条件对非平衡空穴所在的高斯形状杂质带宽度和能量位置的影响。杂质带的能级被证明是由带相反电荷的晶体缺陷(所谓的结合)的结合引起的,包括几个浅层的供体杂质原子和一个深层的结构缺陷。这些状态的高斯展宽的原因是在一个给定的关联中相互之间的关联缺陷的随机空间排列。[忽略俄语文本]。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信