{"title":"High-voltage tolerant watchdog comparator in a low-voltage CMOS technology","authors":"V. Potanin, E. E. Potanina","doi":"10.1109/ICECS.2004.1399670","DOIUrl":null,"url":null,"abstract":"A watchdog comparator is presented that is tolerant of supply voltages significantly higher than the process limit for individual CMOS transistors. The circuit demonstrates very low current consumption, and has a fast dynamic response. The described circuit was implemented in the battery charger block of a power management IC for cellular phones. The implemented watchdog comparator is tolerant of input voltages up to 12 V and passes operational life and reliability tests. Extensive evaluation under various start-up conditions shows circuit compliance to contradictory specification parameters. Simulation and measurement data for various power-up transient conditions are presented.","PeriodicalId":38467,"journal":{"name":"Giornale di Storia Costituzionale","volume":"600 1","pages":"270-273"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Giornale di Storia Costituzionale","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2004.1399670","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Arts and Humanities","Score":null,"Total":0}
引用次数: 0
Abstract
A watchdog comparator is presented that is tolerant of supply voltages significantly higher than the process limit for individual CMOS transistors. The circuit demonstrates very low current consumption, and has a fast dynamic response. The described circuit was implemented in the battery charger block of a power management IC for cellular phones. The implemented watchdog comparator is tolerant of input voltages up to 12 V and passes operational life and reliability tests. Extensive evaluation under various start-up conditions shows circuit compliance to contradictory specification parameters. Simulation and measurement data for various power-up transient conditions are presented.