Scanning Probe Microscopy

Abstract

Scanning probe microscopy (SPM) is widely used for characterizing surface morphology and properties. In the SPM family, atomic force microscopy (AFM) is useful for insulating materials under various atmospheres. And AFM facilitates the study of aggregation structures of surfactants on solid surfaces. In this review, SPM, especially AFM, are briefly explained and AFM images of surfactants are presented. Molecular arrangements of surfactant single crystals were visualized and found consistent with the results of x-ray diffraction. Heterogeneous growth and self-repair of surfactant aggregates at an aqueous solution/silica interface could be observed by in situ AFM. The morphology of various surfactants aggregate on solid surfaces was studied by soft contact AFM under various conditions.