Holbein Eli FLORES-LÓPEZ, C. LÓPEZ-GARCÍA, Jorge Santiago-Amaya
{"title":"Numerical modeling of the behavior of a lithium battery after a collision","authors":"Holbein Eli FLORES-LÓPEZ, C. LÓPEZ-GARCÍA, Jorge Santiago-Amaya","doi":"10.35429/jrd.2023.23.9.1.9","DOIUrl":null,"url":null,"abstract":"This study is carried out to verify numerically the deformation and Von Misses stresses of a lithium-Ion battery (Li6PF 43 ah, 3.7v) after impact against a solid sphere, using the specialized program in Dynamic Simulation. and Ls-Dyna Finite Elements. With the aim of advancing in the studies to validate the safety of batteries in electric cars this study creates a model of the analyzed prismatic battery.","PeriodicalId":55034,"journal":{"name":"IBM Journal of Research and Development","volume":null,"pages":null},"PeriodicalIF":1.3000,"publicationDate":"2023-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IBM Journal of Research and Development","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.35429/jrd.2023.23.9.1.9","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Computer Science","Score":null,"Total":0}
引用次数: 0
Abstract
This study is carried out to verify numerically the deformation and Von Misses stresses of a lithium-Ion battery (Li6PF 43 ah, 3.7v) after impact against a solid sphere, using the specialized program in Dynamic Simulation. and Ls-Dyna Finite Elements. With the aim of advancing in the studies to validate the safety of batteries in electric cars this study creates a model of the analyzed prismatic battery.
期刊介绍:
The IBM Journal of Research and Development is a peer-reviewed technical journal, published bimonthly, which features the work of authors in the science, technology and engineering of information systems. Papers are written for the worldwide scientific research and development community and knowledgeable professionals.
Submitted papers are welcome from the IBM technical community and from non-IBM authors on topics relevant to the scientific and technical content of the Journal.