Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography

J. Altepeter, D. Branning, E. Jeffrey, C. Wei, P. Kwiat, R. Thew, J. O'Brien, M. Nielsen, A.G. White
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引用次数: 2

Abstract

Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.
单量子位,纠缠辅助和辅助量子过程断层扫描
量子过程层析成像允许完整和精确的表征量子操作。我们报告了使用单量子位、最大纠缠和非纠缠输入状态的单一、退相干和部分极化操作的量子过程层析成像。
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