A comparison method for THz measurements using VNA and TDS

2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) Pub Date : 2015-11-12 DOI:10.1109/IRMMW-THZ.2015.7327635

M. Naftaly, N. Ridler, J. Molloy, N. Shoaib, Daniel Stokes

引用次数: 5

Abstract

A method is described for direct comparison of dielectric measurements obtained by a vector network analyzer and a time domain spectrometer. The method employs a material that can be inserted into a waveguide for VNA measurements or contained in a cell for TDS measurements.

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用VNA和TDS测量太赫兹的比较方法

本文描述了一种直接比较由矢量网络分析仪和时域光谱仪所获得的介电测量值的方法。该方法采用一种材料，该材料可以插入到波导中进行VNA测量或包含在单元中进行TDS测量。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)

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