Factors influencing conduction currents in Teflon

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI:10.1109/ICSD.1998.709272

G. Raju, M. A. Sussi

引用次数: 1

Abstract

Conduction currents in Teflon (PolyTetraFluoroEthylene, PTFE) films having thickness of 50 /spl mu/m and 130 /spl mu/m are measured over a temperature range of 40-200/spl deg/C and electric field strengths up to 246 kV cm/sup -1/. The importance of space charge effects in both ionic and electronic conduction at different temperature ranges are discussed.

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聚四氟乙烯传导电流的影响因素

在厚度为50 /spl mu/m和130 /spl mu/m的Teflon(聚四氟乙烯，PTFE)薄膜中测量传导电流，温度范围为40-200/spl°/C，电场强度高达246 kV cm/sup -1/。讨论了空间电荷效应在不同温度范围内离子和电子传导中的重要性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)

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