{"title":"The comparison of two supercapacitors lifetime estimated on the basis of accelerated degradation tests by means of stochastic models","authors":"R. Kopka, W. Tarczyński","doi":"10.21008/J.1508-4248.2016.0007","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":10642,"journal":{"name":"Computer Applications in Electrical Engineering","volume":"78 3 1","pages":"77-88"},"PeriodicalIF":0.0000,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Computer Applications in Electrical Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21008/J.1508-4248.2016.0007","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}