Siming Li, R. Farshchi, Michael F. Miller, A. Arehart, D. Kuciauskas
{"title":"Optical Characterization of Defects in High-efficiency (Ag, Cu)(In, Ga)Se2","authors":"Siming Li, R. Farshchi, Michael F. Miller, A. Arehart, D. Kuciauskas","doi":"10.2172/1808862","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6773,"journal":{"name":"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)","volume":"10 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2172/1808862","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}