Tunneling times through dielectric stacks

2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science Pub Date : 2008-05-04 DOI:10.1109/QELS.2008.4552995

N. Rutter, S. Polyakov, P. Lett, A. Migdall

引用次数: 0

Abstract

We measure the photon tunneling time through bandgaps of dielectric layer stacks with alternating refractive indices. We observe subtle structural changes in dielectric stacks drastically affecting photon traversal times, allowing for sub- and superluminal effects.

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通过电介质堆叠的隧道时间

我们测量了光子通过具有交变折射率的介电层堆叠带隙的隧穿时间。我们观察到介电堆中细微的结构变化极大地影响光子穿越时间，从而允许亚光速和超光速效应。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science

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