V. Aeistov, U. Winter, A. Ntkitltn, S. Redkin, A. Snigirev, P. Zaumseil, V. Yunkln
{"title":"Interference Thickness Oscillations of an X-Ray Wave on Periodically Profiled Silicon3)","authors":"V. Aeistov, U. Winter, A. Ntkitltn, S. Redkin, A. Snigirev, P. Zaumseil, V. Yunkln","doi":"10.1515/9783112492963-021","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":11072,"journal":{"name":"Day 1 Mon, August 16, 2021","volume":"454 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"1988-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Day 1 Mon, August 16, 2021","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/9783112492963-021","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
