{"title":"Electronic Prognostics Through Advanced Modeling Techniques","authors":"J. Line, A. Iyer","doi":"10.1109/AERO.2007.352906","DOIUrl":null,"url":null,"abstract":"Electronic prognostics is a growing field important to both military and commercial applications. When implemented, this capability will greatly enhance the maintenance management of platforms. Electronic prognostics require extensive use of physics of failure models to predict the remaining useful life of complex electronic failure modes.","PeriodicalId":6295,"journal":{"name":"2007 IEEE Aerospace Conference","volume":"41 1","pages":"1-7"},"PeriodicalIF":0.0000,"publicationDate":"2007-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Aerospace Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AERO.2007.352906","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Electronic prognostics is a growing field important to both military and commercial applications. When implemented, this capability will greatly enhance the maintenance management of platforms. Electronic prognostics require extensive use of physics of failure models to predict the remaining useful life of complex electronic failure modes.