SUBWAVE: a methodology for modeling digital substrate noise injection in mixed-signal ICs

Abstract

A methodology is presented for generating compact models of substrate noise injection in complex logic networks. For a given gate library, the injection patterns associated with a gate and an input transition scheme are accurately evaluated using device-level simulation. Assuming spatial independence of all noise generating devices, the cumulative switching noise resulting from all injection patterns is efficiently computed using a gate-level event-driven simulator. The resulting injected signal is then sampled and translated into an energy spectrum which accounts for fundamental frequencies as well as glitch energy. Preliminary results demonstrate the validity of the assumptions and the accuracy of the approach on a set of standard benchmark circuits.