Calorimetric measurements with compensating temperature control

Abstract

Measuring the dissipated power of fast switching semiconductors or magnetic components with low power factor makes high demands on the accuracy of the measurement equipment. Calorimetric measurement methods represent a possible solution for this problem but are considered as being too time demanding. A compensating temperature control facilitates to reduce the time demand for a single measurement from 240 to 30 minutes. Experimental results demonstrate the accuracy of the proposed measurement method.