Finite Rate of Innovation Sampling System Based on Modified Exponential Reproducing Sampling Kernel: Finite Rate of Innovation Sampling System Based on Modified Exponential Reproducing Sampling Kernel
IF 0.5 4区 工程技术Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
{"title":"Finite Rate of Innovation Sampling System Based on Modified Exponential Reproducing Sampling Kernel: Finite Rate of Innovation Sampling System Based on Modified Exponential Reproducing Sampling Kernel","authors":"Yajun Wang, Ming Li, Gaofeng Liu","doi":"10.3724/SP.J.1146.2013.00059","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":51678,"journal":{"name":"电子与信息学报","volume":"18 1","pages":"2088-2093"},"PeriodicalIF":0.5000,"publicationDate":"2014-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"电子与信息学报","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.3724/SP.J.1146.2013.00059","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}