Defect-tolerant logic implementation onto nanocrossbars by exploiting mapping and morphing simultaneously

Yehua Su, Wenjing Rao
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引用次数: 8

Abstract

Crossbar-based architectures are promising for the future nanoelectronic systems. However, due to the inherent unreliability, defect tolerance schemes are necessary to guarantee the successful implementations of any logic functions. Most of the existing approaches have been based on logic mapping, which exploits the freedom of choosing which variables/products (in a logic function) to map to which of the vertical/horizontal wires (in a crossbar). In this paper, we propose a new defect tolerance approach, namely logic morphing, by exploiting the various equivalent forms of a logic function. This approach explores a new dimension of freedom in achieving defect tolerance, and is compatible with the existing mapping-based approaches. We propose an integrated algorithmic framework, which employs both mapping and morphing simultaneously, and efficiently searches for a successful logic implementation in the combined solution space. Simulation results show that the proposed scheme boosts defect tolerance capability significantly with many-fold yield improvement, while having no extra runtime over the existing approach of performing mapping alone.
同时利用映射和变形在纳米交叉棒上实现容错逻辑
交叉棒结构在未来的纳米电子系统中很有前途。然而,由于固有的不可靠性,缺陷容忍方案是保证任何逻辑功能成功实现的必要条件。大多数现有的方法都是基于逻辑映射的,它利用了选择哪些变量/产品(在逻辑函数中)映射到哪个垂直/水平线(在横杆中)的自由。本文利用逻辑函数的各种等价形式,提出了一种新的缺陷容错方法,即逻辑变形。这种方法在实现缺陷容忍度方面探索了自由的新维度,并且与现有的基于映射的方法兼容。我们提出了一个集成的算法框架,该框架同时使用映射和变形,并有效地在组合解空间中搜索成功的逻辑实现。仿真结果表明,该方案在不增加运行时间的前提下,显著提高了缺陷容忍度,良率提高了数倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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