Ultrafast Phonon Decay in Complex Oxides

3区 物理与天体物理 Q1 Materials Science
C. Neupane, J. Sylvester, D. M. Mudiyanselage, H. Singhapurage, F. Ganikhanov
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引用次数: 0

Abstract

The decay of multiple Raman active vibrations has been directly traced, in time, in technologically important wide bandgap semiconduction oxides such as BaSnO3 (BSO), STiO3 (STO), and KTiOPO4 (KTP) crystal, which have important applications in laser frequency conversion. A time-domain coherent Raman technique, with excellent time (~120 fs) and spectral resolutions, has been applied to measure the ultrafast decay rates of optical phonons with 350–1500 cm−1 frequencies. Phonon decay mechanisms via phonon energy loss due to second- and third-order parametric processes have been discussed. The correspondingly high equivalent spectral resolution allowed for the determination of the phonon line bandwidths to be within 7.2–8.3 cm−1 (BSO), 8.5–9.7 cm−1 (STO), and 6.2–18.6 cm−1 (KTP).
复合氧化物中的超快声子衰变
在技术上重要的宽禁带半导体氧化物如BaSnO3 (BSO), STiO3 (STO)和KTiOPO4 (KTP)晶体中,多次拉曼主动振动的衰减已被及时直接追踪,这些氧化物在激光频率转换中具有重要应用。一种时域相干拉曼技术,具有优异的时间(~ 120fs)和光谱分辨率,已被用于测量350 - 1500cm−1频率的光学声子的超快衰减率。讨论了由二阶和三阶参数过程引起的声子能量损失引起的声子衰变机制。相应的高等效光谱分辨率允许声子线带宽的测定在7.2-8.3 cm−1 (BSO), 8.5-9.7 cm−1 (STO)和6.2-18.6 cm−1 (KTP)之间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Progress in Optics
Progress in Optics 物理-光学
CiteScore
4.50
自引率
0.00%
发文量
8
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