The Effect of Powdered Layer on the Physicochemical Properties of Silicone Rubber Surface

Huan Huang, T. Liang, Xiaohong Ma, Jianrong Wu, Qi Yang, Ying Zhang, Bo Li
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Abstract

In this paper, the pulverization phenomenon of composite insulator shed from three different environmental conditions was studied. Several methods were used to test the effect of powdered layer on the physical and chemical properties of silicone rubber surface. Scanning electron microscopy (SEM) was used to observe the surface morphology of the materials. The hydrophobicity of insulator shed is characterized by static contact angle. The surface profile parameters of composite insulator are obtained by detecting the surface of composite insulator with a stylus roughness meter. EDS and FTIR were used to study the elemental composition and chemical groups. The dielectric parameters at different frequencies were obtained by broadband dielectric spectrum scanner. It was observed that the hydrophobicity, roughness and dielectric properties of the composite insulator sample become worse after removing the powdered layer, the chemical composition of the surface can be restored to the fresh state of the silicone rubber. However, the influence trend of powdering on the surface hydrophobicity of composite insulator is not uniform. For composite insulator with serious pulverization, the hydrophobicity will not be improved after removing the powdered layer. The surface roughness of composite insulator will increase greatly due to pulverization. The powdered layer on the surface of composite insulator is mainly composed of small molecules formed by degradation of silicone rubber main chain and fillers separated from the material. The dielectric properties will decrease slightly after de-powdering.
粉末层对硅橡胶表面物理化学性能的影响
本文研究了三种不同环境条件下复合绝缘子外壳的粉碎现象。采用几种方法测试了粉末层对硅橡胶表面物理化学性能的影响。利用扫描电子显微镜(SEM)观察了材料的表面形貌。绝缘子棚的疏水性用静态接触角来表征。采用触针式粗糙度仪对复合绝缘子表面进行检测,得到复合绝缘子的表面轮廓参数。利用EDS和FTIR对其元素组成和化学基团进行了研究。利用宽带介质谱扫描仪获得了不同频率下的介电参数。结果表明,去除粉末层后,复合绝缘子样品的疏水性、粗糙度和介电性能变差,表面的化学成分可以恢复到硅橡胶的新鲜状态。但粉末对复合绝缘子表面疏水性的影响趋势并不均匀。对于粉化严重的复合绝缘子,除去粉层后疏水性不会得到改善。复合绝缘子的表面粗糙度会因粉碎而大大提高。复合绝缘子表面的粉末状层主要由硅橡胶主链降解形成的小分子和从材料中分离出来的填料组成。脱粉后介电性能略有下降。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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