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Semi-automated Test Migration for BPMN-Based Process-Driven Applications

2018 IEEE 22nd International Enterprise Distributed Object Computing Conference (EDOC) Pub Date : 2022-01-01 DOI:10.1007/978-3-031-17604-3_14
Konrad Schneid, S. Thöne, H. Kuchen
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基于bpmn的流程驱动应用程序的半自动测试迁移
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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来源期刊
2018 IEEE 22nd International Enterprise Distributed Object Computing Conference (EDOC)
2018 IEEE 22nd International Enterprise Distributed Object Computing Conference (EDOC)
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